The Nova NanoSEM 450 scanning electron microscope (SEM) at the LUMS Physlab, Department of Physics, Syed Babar Ali School of Science and Engineering (SBASSE) delivers state-of-the-art imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in a laboratory, the Nova NanoSEM enables users the ability to obtain a comprehensive analysis of a wide range of samples.
The SEM is a field-emission machine with promised resolutions of up to 0.8 nm under ideal imaging conditions. With built-in ETD and TLD detectors for HR and UHR imaging, some external detectors like Low Vacuum Detector (LVD), Back Scattered Detector (BSD) and Scanning-transmission Electron Microscope Detector (STEM) are also available and can be activated according to requirements. The microscope is also equipped with very highly precise Oxford Energy Dispersive X-ray (EDX) detector for qualitative and quantitative compositional analysis. The point, line and map scans with composition measurements can easily be extracted from the samples with this system. Raith e-beam lithography system is also installed alongside the SEM for rapid pattern generating.