Scanning Electron Microscope (SEM) at the LUMS SBASSE

Monday, February 9, 2015

The Nova NanoSEM 450 scanning electron microscope (SEM) at the LUMS Physlab, Department of Physics, Syed Babar Ali School of Science and Engineering (SBASSE) delivers state-of-the-art imaging and analytical performance in a single, easy-to-use instrument. Specifically designed to streamline operations in a laboratory, the Nova NanoSEM enables users the ability to obtain a comprehensive analysis of a wide range of samples.

The SEM is a field-emission machine with promised resolutions of up to 0.8 nm under ideal imaging conditions. With built-in ETD and TLD detectors for HR and UHR imaging, some external detectors like Low Vacuum Detector (LVD), Back Scattered Detector (BSD) and Scanning-transmission Electron Microscope Detector (STEM) are also available and can be activated according to requirements. The microscope is also equipped with very highly precise Oxford Energy Dispersive X-ray (EDX) detector for qualitative and quantitative compositional analysis. The point, line and map scans with composition measurements can easily be extracted from the samples with this system. Raith e-beam lithography system is also installed alongside the SEM for rapid pattern generating.